The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band bending in perovskite and Cu(In,Ga)Se<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" id="d1e210" altimg="si5.svg"><mml:msub><mml:mrow /><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:math> solar cells

نویسندگان

چکیده

An in-depth understanding of the electronic properties grain boundaries (GBs) in polycrystalline semiconductor absorbers is high importance since their charge carrier recombination rates may be very and hence limit solar cell device performance. Kelvin Probe Force Microscopy (KPFM) method choice to investigate GB band bending on nanometer scale thereby helps develop passivation strategies. Here, it shown that workfunction, measured with amplitude modulation (AM)-KPFM, which by far most common KPFM measurement mode, prone exhibit artifacts at typical such as Cu(In,Ga)Se2 CH3NH3PbI3. This a direct consequence change cantilever–sample distance varies rough samples. Furthermore, we critically discuss impact different environments (air versus vacuum) show air exposure alters facet contrast, leads erroneous interpretations physics. Frequency (FM)-KPFM measurements non-air-exposed CIGSe perovskite amount negligible landscape surface dominated facet-related contrast due nature absorbers.

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ژورنال

عنوان ژورنال: Nano Energy

سال: 2021

ISSN: ['2211-3282', '2211-2855']

DOI: https://doi.org/10.1016/j.nanoen.2021.106270