The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band bending in perovskite and Cu(In,Ga)Se<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" id="d1e210" altimg="si5.svg"><mml:msub><mml:mrow /><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:math> solar cells
نویسندگان
چکیده
An in-depth understanding of the electronic properties grain boundaries (GBs) in polycrystalline semiconductor absorbers is high importance since their charge carrier recombination rates may be very and hence limit solar cell device performance. Kelvin Probe Force Microscopy (KPFM) method choice to investigate GB band bending on nanometer scale thereby helps develop passivation strategies. Here, it shown that workfunction, measured with amplitude modulation (AM)-KPFM, which by far most common KPFM measurement mode, prone exhibit artifacts at typical such as Cu(In,Ga)Se2 CH3NH3PbI3. This a direct consequence change cantilever–sample distance varies rough samples. Furthermore, we critically discuss impact different environments (air versus vacuum) show air exposure alters facet contrast, leads erroneous interpretations physics. Frequency (FM)-KPFM measurements non-air-exposed CIGSe perovskite amount negligible landscape surface dominated facet-related contrast due nature absorbers.
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چکیده ندارد.
15 صفحه اولPractical aspects of Kelvin probe force microscopy
We discuss practical aspects of Kelvin probe force microscopy ~KFM! which are important to obtain stable images of the electric surface potential distribution at high spatial resolution ~,100 nm! and high potential sensitivity ~,1 mV! on conducting and nonconducting samples. We compare metal-coated and semiconducting tips with respect to their suitability for KFM. Components of the metal coatin...
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ژورنال
عنوان ژورنال: Nano Energy
سال: 2021
ISSN: ['2211-3282', '2211-2855']
DOI: https://doi.org/10.1016/j.nanoen.2021.106270